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Analytical Service

The Materials Characterization group of MNF provides  analytical services on a scientific collaboration and/or commercial basis. We can support you to solve your analytical issues and support your R&D activities by our analytical instrumentation and expertise on surface and materials analysis.

In particular we offer
•    semiconductors related analysis
•    thin films characterisation
•    surface analysis
•    failure analysis
•    characterisation of metallurgical surface treatments
•    coatings characterization
•    volatile organic compounds analysis

In the following table we indicate measurements routinely performed in our laboratories. Different tests are performed on specific request.

technique

material

test

method

Accreditation by ACCREDIA

XPS

Silicon Oxides

thickness of silicon oxides on silicon (1-10 nm).

MI-01 2010

x

XPS

solids

elemental identification

MI-04 2012

x

XPS

solids/powders

contamination detection and quantification

   

XPS

solids/powders

elemental concentration and speciation

   

SIMS

silicon

boron concentrazione in uniformly doped silicon

ISO 14237:2010

x

SIMS

silicon

depth profiling of boron in silicon (1E16 - 1E20 atomi/cm3)

ISO 17560:2002

x

SIMS

silicon

depth profiling of phosphorus in silicon (1E16 - 1E20 atomi/cm3)

MI-02 2010

x

SIMS

silicon

depth profiling of arsenic in silicon

ISO 12406:2010

x

SIMS

silicon

concentration and depth profiling o phosphorus/boron/arsenic/antimony/tin

   

ToF-SIMS

 

Organic and trace contaminants

   

PXRD

ferritic steel

Residual stress analysis

UNI EN 15305:2008

x

PXRD

powders

Structural/compositional analysis (cristallographic phases)

   

SEM/EDS

solids

Surface imaging and elemental compoisition

   

SEM

membranes/filters

aerodispersed asbestos fibres

DM 06/09/1994 All 2 B GU SO n° 288 10/12/1994

(escluso campionamento)

x

AFM

solids

morphological surface characterisation

   

TXRF/GIXRF

surfaces / thin films

contamination / elemental composition of thin films

   

PTRMS

solids/gases

analysis of volatile organic compounds

   
Terms of use: 

Infomation/request/quotation

Please contact us at info.mnf@fbk.eu or fill in the contact form.

If you prefer you can contact us by phone:

tel. +39 0461 314 491  Giancarlo Pepponi

tel. +39 0461 314 485  Massimo Bersani

 

Samples delivery

Samples can be delivered

  • Directly by the custumer to FBK personnel

  • Sent by regular mail or express courier.

The delivery/shipping address is reported in the Samples delivery form.

 

Advice for sample packaging and shipment

Analytical test

Advice for packaging

Organic contaminants

No plastic bags or boxes

Inorganic contaminants

Plastic or polymeric boxes can be used which do not contain the elements object of investigation

Depth profiling

Packaging not critical

Asbestos fibres on filters

Filters must be delivered in the original enclosures used when sampling

Organic volatile compounds

If solids samples are to be investigated, do not mark the samples with inks

For other kinds of analysis please contact us

Quantity

In the table specific requirements for each technique are indicated.

Analytical technique

Minimal dimensions

Constraint

XPS

6x2 mm2

primary beam size: 5x1 mm2

SIMS

6x6 mm2

sample holder size: 6x6 mm2

ToF-SIMS, AFM, SEM

1x1 mm2

sample handling

TXRF

25x10 mm2

primary beam size

Documents to be attached

Samples must be delivered with a document with a description including area to be analysed, material, hazards, costumer details. Please download and fill in the form MOD_PG-07_01: Samples delivery form

 

Documents: