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Materials Characterization

MNF Area for material characterization activity is focused on solving novel
analytical issues and supporting material science and technology development by
state-of-the-art analytical instrumentation and capabilities 

Acronym Technique Model Company
SIMS Dynamic Secondary Ion Mass Spectometry SC-ULTRA CAMECA
ToF-SIMS Time of Flight Secondary Ion Mass Spectometry TOF-SIMS IV Iontof
PTR-MS Proton Transfer Mass Spectometry  PTR-MS Kore Technology
SEM Scanning Electron Microscopy JMS-7401F Jeol
AFM Atomic Force Miscroscopy Solver Uni (P47) NT-MDT
AFM Atomic Force Microscopy Solver P47H NT-MDT
XPS X-Ray Photoelectron Spectrometry Axis-Ultra Kratos
XPS X-Ray Photoelectron Spectrometry ESCA 200 Scienta
AES Auguer Electron Spectrometry Model 590 PHI
AES Auguer Electron Spectrometry Model 4200 PHI
EDX/EBSD Energy Dispersive X-Ray/ Electron backscatter diffraction Bruker Jeol
TXRF Total Reflection X-Ray Fluorescence TXRF 8010W Atomika
XRD/XRF X-Ray Diffraction-Fluroscence-Reflectory-Glacing Incident fluorescence Prototype TNK
XRD X-Ray Diffraction APD 2000 Italstructure
Nano Hard CSM Mano Hardness Micro Scratch Tester   CSM Instrument
Profilometer Mechanical Profilometer P-6 KLA-Tencor


If you have any analytical requirements

If you need material characterization service

If your research project will be improved by analytical support

See more info in Service

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