You are here

Materials Characterization

MNF Area for material characterization activity is focused on solving novel
analytical issues and supporting material science and technology development by
state-of-the-art analytical instrumentation and capabilities 

Acronym Technique Model Company
SIMS Dynamic Secondary Ion Mass Spectometry SC-ULTRA CAMECA
ToF-SIMS Time of Flight Secondary Ion Mass Spectometry TOF-SIMS IV Iontof
PTR-MS Proton Transfer Mass Spectometry  PTR-MS Kore Technology
SEM Scanning Electron Microscopy JMS-7401F Jeol
AFM Atomic Force Miscroscopy Solver Uni (P47) NT-MDT
AFM Atomic Force Microscopy Solver P47H NT-MDT
XPS X-Ray Photoelectron Spectrometry Axis-Ultra Kratos
XPS X-Ray Photoelectron Spectrometry ESCA 200 Scienta
AES Auguer Electron Spectrometry Model 590 PHI
AES Auguer Electron Spectrometry Model 4200 PHI
EDX/EBSD Energy Dispersive X-Ray/ Electron backscatter diffraction Bruker Jeol
TXRF Total Reflection X-Ray Fluorescence TXRF 8010W Atomika
XRD/XRF X-Ray Diffraction-Fluroscence-Reflectory-Glacing Incident fluorescence Prototype TNK
XRD X-Ray Diffraction APD 2000 Italstructure
Nano Hard CSM Mano Hardness Micro Scratch Tester   CSM Instrument
Profilometer Mechanical Profilometer P-6 KLA-Tencor

 

If you have any analytical requirements

If you need material characterization service

If your research project will be improved by analytical support

See more info in Service

Or contact us directly at